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VLSI test principles and architectures /

VLSI test principles and architectures / edited by Laung-Terng Wang, Cheng-Wen Wu and Xiaoging Wen - Amsterdam : Morgan Kaufmann, c2006. - xx, 495 p. : ill. ; 24 cm.

ISBN: 0123705976

LCCN:

Subjects--Topical Terms:
Integrated circuits
Very large scale Metal oxide semiconductors
Design Computer engineering

LC Class. No.: TK7874.75 / .V587 2006

Dewey Class. No.: 621.395 / V627

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VLSI test principles and architectures /