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Logic testing and design for testability /

Fujiwara, Hideo

Logic testing and design for testability / Hideo Fujiwara - Cambridge : MIT Press, c1985. - x, 284 p. : ill. ; 24 cm. - MIT Press series in computer systems .

ISBN: 0262060965

LCCN:

Subjects--Topical Terms:
Logic circuits
Testing

LC Class. No.: TK7868 / .L6F85 1985

Dewey Class. No.: 621.381537 / F961l

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Logic testing and design for testability /