TY  - BOOK
AU  - Chakraborty,Kanad
AU  - Mazumder,Pinaki
TI  - Fault-tolerance and reliability techniques for high-density random-access memories: an introduction to natural language processing, computational linguistics and speech recognition 
SN  - 0130084654
AV  - TK7895 .M4C44 2002
U1  - 621.3973 
PY  - 2002///
CY  - New Delhi
PB  - Prentice Hall
KW  - Random access memory
KW  - Reliability Integrated circuits
KW  - Fault tolerance Semiconeductor storage devices
ER  -