TY  - BOOK
AU  - Gupta,Dinesh C.
AU  - Bacher,Fred R.
AU  - Hughes,William M.
TI  - Recombination lifetime measurements in silicon
SN  - 0803124899
AV  - TK7871.852 .R43 1998
U1  - 621.38152 
PY  - 1998///
CY  - West Conshohocken
PB  - ASTM
KW  - Semiconductors
KW  - Testing
KW  - Congresses Service life (Engineering)
KW  - Forecasting Electronic measurements
N1  - Includes index
ER  -