VLSI test principles and architectures / 
edited by Laung-Terng Wang, Cheng-Wen Wu and Xiaoging Wen 
 - Amsterdam :  Morgan Kaufmann,  c2006. 
 - xx, 495 p. :  ill. ;  24 cm. 
<br/><br/><label>ISBN: </label>0123705976 
<br/><br/><label>LCCN: </label>
<br/><br/><label>Subjects--Topical Terms: </label><br/>Integrated circuits<br/>Very large scale Metal oxide semiconductors<br/>Design Computer engineering
<br/><br/><label>LC Class. No.: </label>TK7874.75  / .V587 2006 
<br/><br/><label>Dewey Class. No.: </label>621.395  / V627