TY  - BOOK
AU  - Wang,Laung-Terng
AU  - Wu,Cheng-Wen
AU  - Wen,Xiaoging
TI  - VLSI test principles and architectures
SN  - 0123705976
AV  - TK7874.75 .V587 2006
U1  - 621.395 
PY  - 2006///
CY  - Amsterdam
PB  - Morgan Kaufmann
KW  - Integrated circuits
KW  - Very large scale Metal oxide semiconductors
KW  - Design Computer engineering
ER  -