Fujiwara, Hideo <br/><br/>
Logic testing and design for testability / 
Hideo Fujiwara 
 - Cambridge :  MIT Press,  c1985. 
 - x, 284 p. :  ill. ;  24 cm. 
 - MIT Press series in computer systems .
<br/><br/><label>ISBN: </label>0262060965 
<br/><br/><label>LCCN: </label>
<br/><br/><label>Subjects--Topical Terms: </label><br/>Logic circuits<br/>Testing
<br/><br/><label>LC Class. No.: </label>TK7868  / .L6F85 1985 
<br/><br/><label>Dewey Class. No.: </label>621.381537  / F961l