TY  - BOOK
AU  - Fujiwara,Hideo
TI  - Logic testing and design for testability
T2  - MIT Press series in computer systems
SN  - 0262060965
AV  - TK7868 .L6F85 1985
U1  - 621.381537 
PY  - 1985///
CY  - Cambridge
PB  - MIT Press
KW  - Logic circuits
KW  - Testing
ER  -