| 000 | nam a22 a 4500 | ||
|---|---|---|---|
| 999 |
_c12555 _d12555 |
||
| 001 | BD-DhNSU-12555 | ||
| 003 | BD-DhNSU | ||
| 005 | 20190402140509.0 | ||
| 008 | 190402s1984 paua|||g |||| 001 0|eng d | ||
| 010 | _a | ||
| 020 | _a | ||
| 040 |
_aDLC _cDLC _dBD-DhNSU |
||
| 041 | _aeng | ||
| 050 | 0 | 0 |
_aQD181 _b.C9S26 1984 |
| 082 | 0 | 0 | _a620.18297 |
| 245 | 0 | 0 |
_aSampling and analysis of copper cathodes : _ba symposium / _cedited by W.M. Tuddenham and R.J. Hibbeln |
| 260 |
_aPhiladelphia : _bAmerican Society for Testing and Materials, _cc1984. |
||
| 300 |
_a184 p. : _bill. ; _c24 cm. |
||
| 500 | _aIncludes index. | ||
| 650 | 0 | _aCopper | |
| 650 | 0 | _aAnalysis | |
| 650 | 4 | _aCongresses | |
| 700 | 1 | _aTuddenham, W.M. | |
| 700 | 1 | _aHibbeln, R.J. | |
| 942 |
_2lcc _cBK |
||