| 000 | nam a22 a 4500 | ||
|---|---|---|---|
| 999 |
_c16455 _d16455 |
||
| 001 | BD-DhNSU-16455 | ||
| 003 | BD-DhNSU | ||
| 005 | 20190403061532.0 | ||
| 008 | 190403s1998 paua|||g |||| 001 0|eng d | ||
| 010 | _a | ||
| 020 | _a0803124899 | ||
| 040 |
_aDLC _cDLC _dBD-DhNSU |
||
| 041 | _aeng | ||
| 050 | 0 | 0 |
_aTK7871.852 _b.R43 1998 |
| 082 | 0 | 0 |
_a621.38152 _bR245 |
| 245 | 0 | 0 |
_aRecombination lifetime measurements in silicon / _cedited by Dinesh C. Gupta, Fred R. Bacher and William M. Hughes |
| 260 |
_aWest Conshohocken : _bASTM, _cc1998. |
||
| 300 |
_a392 p. : _bill. ; _c24 cm. |
||
| 500 | _aIncludes index. | ||
| 650 | 0 | _aSemiconductors | |
| 650 | 0 | _aTesting | |
| 650 | 4 | _aCongresses Service life (Engineering) | |
| 650 | 4 | _aForecasting Electronic measurements | |
| 700 | 1 | _aGupta, Dinesh C. | |
| 700 | 1 | _aBacher, Fred R. | |
| 700 | 1 | _aHughes, William M. | |
| 942 |
_2lcc _cBK |
||