| 000 | nam a22 a 4500 | ||
|---|---|---|---|
| 999 |
_c17163 _d17163 |
||
| 001 | BD-DhNSU-17163 | ||
| 003 | BD-DhNSU | ||
| 005 | 20190403061841.0 | ||
| 008 | 190403s1985 enka|||g |||| 001 0|eng d | ||
| 010 | _a | ||
| 020 | _a0262060965 | ||
| 040 |
_aDLC _cDLC _dBD-DhNSU |
||
| 041 | _aeng | ||
| 050 | 0 | 0 |
_aTK7868 _b.L6F85 1985 |
| 082 | 0 | 0 |
_a621.381537 _bF961l |
| 100 | 1 | _aFujiwara, Hideo | |
| 245 | 0 | 0 |
_aLogic testing and design for testability / _cHideo Fujiwara |
| 260 |
_aCambridge : _bMIT Press, _cc1985. |
||
| 300 |
_ax, 284 p. : _bill. ; _c24 cm. |
||
| 490 | 1 | _aMIT Press series in computer systems | |
| 650 | 0 | _aLogic circuits | |
| 650 | 4 | _aTesting | |
| 942 |
_2lcc _cBK |
||