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Recombination lifetime measurements in silicon /

Recombination lifetime measurements in silicon / edited by Dinesh C. Gupta, Fred R. Bacher and William M. Hughes - West Conshohocken : ASTM, c1998. - 392 p. : ill. ; 24 cm.

Includes index.

ISBN: 0803124899

LCCN:

Subjects--Topical Terms:
Semiconductors
Testing
Congresses Service life (Engineering)
Forecasting Electronic measurements

LC Class. No.: TK7871.852 / .R43 1998

Dewey Class. No.: 621.38152 / R245

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Recombination lifetime measurements in silicon /