Recombination lifetime measurements in silicon / edited by Dinesh C. Gupta, Fred R. Bacher and William M. Hughes

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Material type: Text

TextLanguage: English Publication details: West Conshohocken : ASTM, c1998.Description: 392 p. : ill. ; 24 cmISBN:

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Holdings
Item type	Current library	Collection	Call number	Copy number	Status	Date due	Barcode
Books	North South University Library	Non-fiction	TK7871.852.R43 1998 (Browse shelf(Opens below))	1	Available		26561
Books	North South University Library	Non-fiction	TK7871.852.R43 1998 (Browse shelf(Opens below))	2	Available		26562

Includes index.

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