North South University Library OPAC

VLSI test principles and architectures / edited by Laung-Terng Wang, Cheng-Wen Wu and Xiaoging Wen

Contributor(s): Material type: TextTextLanguage: English Publication details: Amsterdam : Morgan Kaufmann, c2006.Description: xx, 495 p. : ill. ; 24 cmISBN:
  • 0123705976
Subject(s): DDC classification:
  • 621.395 V627
LOC classification:
  • TK7874.75 .V587 2006
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Item type Current library Collection Call number Copy number Status Date due Barcode
Books Books North South University Library Non-fiction TK7874.75.V587 2006 (Browse shelf(Opens below)) 1 Available 27336

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