Recombination lifetime measurements in silicon / edited by Dinesh C. Gupta, Fred R. Bacher and William M. Hughes
Material type: TextLanguage: English Publication details: West Conshohocken : ASTM, c1998.Description: 392 p. : ill. ; 24 cmISBN:- 0803124899
- 621.38152 R245
- TK7871.852 .R43 1998
Item type | Current library | Collection | Call number | Copy number | Status | Date due | Barcode | |
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Books | North South University Library | Non-fiction | TK7871.852.R43 1998 (Browse shelf(Opens below)) | 1 | Available | 26561 | ||
Books | North South University Library | Non-fiction | TK7871.852.R43 1998 (Browse shelf(Opens below)) | 2 | Available | 26562 |
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TK7871.85.S77 2016 Solid state electronic devices / | TK7871.85.S77 2016 Solid state electronic devices / | TK7871.852.R43 1998 Recombination lifetime measurements in silicon / | TK7871.852.R43 1998 Recombination lifetime measurements in silicon / | TK7871.99.M44K36 2003 CMOS digital integrated circuits : | TK7872.T73T485 1966 Charcteristics and limitations of transistors / | TK7874.65R33 2003 Digital integrated circuits : |
Includes index.
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